Diffractive properties of surface-relief microstructures

Dong-Ning Qu; Ronald E. Burge; XiaoCong Yuan

doi:10.1117/12.45970

1 August 1991 Diffractive properties of surface-relief microstructures

Dong-Ning Qu, Ronald E. Burge, XiaoCong Yuan

Proceedings Volume 1506, Micro-Optics II; (1991) https://doi.org/10.1117/12.45970
Event: ECO4 (The Hague '91), 1991, The Hague, Netherlands

Abstract

By analyzing the complex values of the electromagnetic fields along surface relief gratings for TE polarization, the diffractive properties of surface relief micro-structures are discussed. The edges and walls of the grooves are found to have significant effects on the surface fields for wavelength-size grooves. The dependence of these effects upon several factors, including the complex refractive index of the material, incident angle and the depth of the grooves, is examined. An oscillating property of the surface field amplitude at the bottom of the grooves against the depth is discovered and discussed. The far field intensity is also found to be closely related to the depth of the grooves.

Citation Download Citation

Dong-Ning Qu, Ronald E. Burge, and XiaoCong Yuan "Diffractive properties of surface-relief microstructures", Proc. SPIE 1506, Micro-Optics II, (1 August 1991); https://doi.org/10.1117/12.45970

ACCESS THE FULL ARTICLE

INSTITUTIONAL
Select your institution to access the SPIE Digital Library.

SELECT YOUR INSTITUTION

PERSONAL
Sign in with your SPIE account to access your personal subscriptions or to use specific features such as save to my library, sign up for alerts, save searches, etc.

PERSONAL SIGN IN

No SPIE Account? Create one

PURCHASE THIS CONTENT

SUBSCRIBE TO DIGITAL LIBRARY

50 downloads per 1-year subscription

Members: $195

Non-members: $335 ADD TO CART

25 downloads per 1 - year subscription

Members: $145

Non-members: $250 ADD TO CART

PURCHASE SINGLE ARTICLE

Includes PDF, HTML & Video, when available