One-dimensional proportional counters for x-ray all-sky monitors

Masaru Matsuoka; Masamitsu Yamauchi; Haruo Nakamura; M. Kondo; Nobuyuki Kawai; Atsumasa Yoshida; Tohru Imai

doi:10.1117/12.48321

1 October 1991 One-dimensional proportional counters for x-ray all-sky monitors

Masaru Matsuoka, Masamitsu Yamauchi, Haruo Nakamura, M. Kondo, Nobuyuki Kawai, Atsumasa Yoshida, Tohru Imai

Proceedings Volume 1549, EUV, X-Ray, and Gamma-Ray Instrumentation for Astronomy II; (1991) https://doi.org/10.1117/12.48321
Event: San Diego, '91, 1991, San Diego, CA, United States

Abstract

The X-ray detection system used to calibrate the Advanced X-ray Astrophysics Facility (AXAF) mirrors will include gas flow and sealed proportional counters. To meet the ultimate 1 percent goal of the calibration project, the transmission and uniformity of the windows must be well known for the soft X-ray wavelengths involved. Various window materials for use with proportional counters are examined for transmission at X-ray wavelengths in the range of 0.1 to 5.9 keV. These include the usual window materials (polypropylene and beryllium), as well as materials only recently employed for detector applications (polyimide and diamond). The transmission uniformity of beryllium at 1.49 keV is examined with a microchannel plate detector, producing a 'shadowgraph' of the window material illuminated with soft X-rays. This technique allows us to investigate nonuniformities on a spatial scale of about .2 mm.

Citation Download Citation

Masaru Matsuoka, Masamitsu Yamauchi, Haruo Nakamura, M. Kondo, Nobuyuki Kawai, Atsumasa Yoshida, and Tohru Imai "One-dimensional proportional counters for x-ray all-sky monitors", Proc. SPIE 1549, EUV, X-Ray, and Gamma-Ray Instrumentation for Astronomy II, (1 October 1991); https://doi.org/10.1117/12.48321

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