Combined x-ray absorption spectroscopy and x-ray powder diffraction

Andrew J. Dent; Gareth E. Derbyshire; G. Neville Greaves; Christine A. Ramsdale; J. W. Couves; Richard Jones; C. Richard A. Catlow; John M. Thomas

doi:10.1117/12.49471

1 November 1991 Combined x-ray absorption spectroscopy and x-ray powder diffraction

Andrew J. Dent, Gareth E. Derbyshire, G. Neville Greaves, Christine A. Ramsdale, J. W. Couves, Richard Jones, C. Richard A. Catlow, John M. Thomas

Author Affiliations +

Proceedings Volume 1550, X Rays in Materials Analysis II: Novel Applications and Recent Developments; (1991) https://doi.org/10.1117/12.49471
Event: San Diego, '91, 1991, San Diego, CA, United States

Abstract

The complementary nature of x-ray absorption fine structure (XAFS) spectroscopy and x-ray diffraction (XRD) is described. In particular XAFS records the local structure while XRD detects the long-range crystallinity enabling the heterogeneity of materials like single-phase catalysts to be explored. Both measurements can be combined to facilitate novel in situ experiments. We have used a horizontal energy dispersed x-ray beam and a photodiode array to detect transmission XAFS and a curved position sensitive detector positioned in the vertical plane to record XRD. This arrangement has been used to follow the formation of mixed-oxide catalysts.

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Andrew J. Dent, Gareth E. Derbyshire, G. Neville Greaves, Christine A. Ramsdale, J. W. Couves, Richard Jones, C. Richard A. Catlow, and John M. Thomas "Combined x-ray absorption spectroscopy and x-ray powder diffraction", Proc. SPIE 1550, X Rays in Materials Analysis II: Novel Applications and Recent Developments, (1 November 1991); https://doi.org/10.1117/12.49471

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