Instrumentation of the variable-angle magneto-optic ellipsometer and its application to m-o media and other nonmagnetic films

Andy Feng Lei Zhou; James Kevin Erwin; Masud Mansuripur

doi:10.1117/12.137551

13 August 1992 Instrumentation of the variable-angle magneto-optic ellipsometer and its application to m-o media and other nonmagnetic films

Andy Feng Lei Zhou, James Kevin Erwin, Masud Mansuripur

Author Affiliations +

Proceedings Volume 1663, Optical Data Storage; (1992) https://doi.org/10.1117/12.137551
Event: Optical Data Storage Topical Meeting, 1992, San Jose, CA, United States

Abstract

A new and comprehensive dielectric tensor characterization instrument is presented for characterization of magneto-optical recording media and non-magnetic thin films. Random and systematic errors of the system are studied. A series of TbFe, TbFeCo, and Co/Pt samples with different composition and thicknesses are characterized for their optical and magneto- optical properties. The optical properties of several non-magnetic films are also measured.

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Andy Feng Lei Zhou, James Kevin Erwin, and Masud Mansuripur "Instrumentation of the variable-angle magneto-optic ellipsometer and its application to m-o media and other nonmagnetic films", Proc. SPIE 1663, Optical Data Storage, (13 August 1992); https://doi.org/10.1117/12.137551

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