Paper
4 May 1993 AFM-characterization of defects in ultralow absorbing coatings for high-power CO2-laser optics
Manfred R. Berger, Martina Chmelir, Herman E. Reedy
Author Affiliations +
Proceedings Volume 1810, 9th International Symposium on Gas Flow and Chemical Lasers; (1993) https://doi.org/10.1117/12.144603
Event: Ninth International Symposium on Gas Flow and Chemical Lasers, 1992, Heraklion, Greece
Abstract
Industrial high power CO2-laser manufacturers strive for the utmost in reliability of their lasers. Since physics is limiting the intrinsic absorption values of optics it is most important to focus on the surface absorption mechanisms which are not yet well understood. AFM techniques are suitable for further investigation into surface related absorption phenomena.
© (1993) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Manfred R. Berger, Martina Chmelir, and Herman E. Reedy "AFM-characterization of defects in ultralow absorbing coatings for high-power CO2-laser optics", Proc. SPIE 1810, 9th International Symposium on Gas Flow and Chemical Lasers, (4 May 1993); https://doi.org/10.1117/12.144603
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KEYWORDS
Absorption

Optical coatings

Charged particle optics

Atomic force microscopy

Surface finishing

Optics manufacturing

Polishing

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