Reliability of high-power semiconductor laser arrays

Hsing H. Kung; Richard R. Craig; Erik P. Zucker; Benjamin Li; Donald R. Scifres

doi:10.1117/12.131263

23 October 1992 Reliability of high-power semiconductor laser arrays

Hsing H. Kung, Richard R. Craig, Erik P. Zucker, Benjamin Li, Donald R. Scifres

Proceedings Volume 1813, Optoelectronic Component Technologies; (1992) https://doi.org/10.1117/12.131263
Event: International Symposium on Optoelectronics in Computers, Communications, and Control, 1992, Hsinchu, Taiwan

Abstract

The reliability of continuously operating (cw) high power laser arrays is a critical factor for the acceptance of these devices in a wide range of applications. Extensive investigation into the reliability of semiconductor lasers has led to an improved understanding of failure mechanisms such as material defects, mirror damage and solder related failures as well as to methods which significantly suppress the occurrence of catastrophic failure. Furthermore, as a result of material quality improvements, laser arrays exhibit very low gradual degradation for high power operation up to 2 Watts cw. Long term lifetest data shows that the projected medium life at room temperature of such devices exceed 100,000 hours at 2 W cw.

Citation Download Citation

Hsing H. Kung, Richard R. Craig, Erik P. Zucker, Benjamin Li, and Donald R. Scifres "Reliability of high-power semiconductor laser arrays", Proc. SPIE 1813, Optoelectronic Component Technologies, (23 October 1992); https://doi.org/10.1117/12.131263

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