Analysis of rocking curve measurements of LiF flight crystals for the objective crystal spectrometer on SPECTRUM-X-GAMMA

Ingolf Halm; Hans-Joachim Wiebicke; U. R.M.E. Geppert; Finn Erland Christensen; Salim Abdali; Herbert W. Schnopper

doi:10.1117/12.162828

19 November 1993 Analysis of rocking curve measurements of LiF flight crystals for the objective crystal spectrometer on SPECTRUM-X-GAMMA

Ingolf Halm, Hans-Joachim Wiebicke, U. R.M.E. Geppert, Finn Erland Christensen, Salim Abdali, Herbert W. Schnopper

Author Affiliations +

Proceedings Volume 2006, EUV, X-Ray, and Gamma-Ray Instrumentation for Astronomy IV; (1993) https://doi.org/10.1117/12.162828
Event: SPIE's 1993 International Symposium on Optics, Imaging, and Instrumentation, 1993, San Diego, CA, United States

Abstract

The Objective Crystal Spectrometer on the SPECTRUM-X-GAMMA satellite will use three types of natural crystals LiF(220), Si(111), RAP(001), and a multilayer structure providing high-resolution X-ray spectroscopy of Fe, S, O, and C line regions of bright cosmic X-ray sources. 330 - 360 LiF(220) crystals of dimensions approximately 23 X 63 mm² are required to cover one side of a large (1000 X 600 mm²) panel, which is to be mounted in front of one of two high throughput X-ray telescopes. Rocking curves of 441 LiF(220) crystals measured by using an expanded Cu - K(alpha) ₂ beam were analyzed to select the best ones for the flight model. An important parameter is the non-parallelity of the crystal lattice planes with respect to the rear side of the crystals, since it is of the same order of magnitude as the rocking curve width. By lapping the rear side to diminish the non- parallelity and selection the main parameters of the rocking curve averaged over all crystals can be improved at least by a factor of 1.6 both in full width half maximum and peak reflectivity.

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Ingolf Halm, Hans-Joachim Wiebicke, U. R.M.E. Geppert, Finn Erland Christensen, Salim Abdali, and Herbert W. Schnopper "Analysis of rocking curve measurements of LiF flight crystals for the objective crystal spectrometer on SPECTRUM-X-GAMMA", Proc. SPIE 2006, EUV, X-Ray, and Gamma-Ray Instrumentation for Astronomy IV, (19 November 1993); https://doi.org/10.1117/12.162828

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