Synthetic measuring deviation of the cantilever coordinate-measuring machine

David Shu; Ya-Xun Zhou

doi:10.1117/12.156411

22 September 1993 Synthetic measuring deviation of the cantilever coordinate measuring machine

David Shu, Ya-Xun Zhou

Proceedings Volume 2101, Measurement Technology and Intelligent Instruments; (1993) https://doi.org/10.1117/12.156411
Event: Measurement Technology and Intelligent Instruments, 1993, Wuhan, China

Abstract

A high precision plate is placed in a quadrant ( I II III IV quadrants) with two posit ions, and with direction cosines of the machine coordinate axes X,Y,Z. When inpute X, Y ; YZ; or Z, X values, then there are output Z ; X ; or Y , Therefore,the difference between the output and the third axis with own component error will be the synthetical measuring deviation. At present we create a mathematical model to describe the interaction of the error components and the synthetical measuring deviation. According to this model, we can obtain the error components from the synthetic deviation.

Citation Download Citation

David Shu and Ya-Xun Zhou "Synthetic measuring deviation of the cantilever coordinate measuring machine", Proc. SPIE 2101, Measurement Technology and Intelligent Instruments, (22 September 1993); https://doi.org/10.1117/12.156411

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