Paper
11 March 1994 Phase-measuring methods for measurement of three-dimensional shapes in automated inspection of manufactured electronic assemblies
Jeremy David Pearson, Francis Lilley, David R. Burton, John T. Atkinson, Shirish P. Kshirsagar, David J. Search, Clifford Allan Hobson
Author Affiliations +
Proceedings Volume 2183, Machine Vision Applications in Industrial Inspection II; (1994) https://doi.org/10.1117/12.171213
Event: IS&T/SPIE 1994 International Symposium on Electronic Imaging: Science and Technology, 1994, San Jose, CA, United States
Abstract
This paper describes research into a noncontact system for the measurement of components and solder on printed circuit boards (PCBs). The objective of the system is the inspection of the PCB to identify faults in the manufacturing process. A fringe pattern is generated on the PCB, using either interferometric methods or projection of a grating, and the image of the fringe pattern is captured and stored on a frame store. The pattern is then processed to reconstruct the 3D shape of the PCB surface from which parameters which relate to PCB integrity can be determined. Results demonstrate the feasibility of the method.
© (1994) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Jeremy David Pearson, Francis Lilley, David R. Burton, John T. Atkinson, Shirish P. Kshirsagar, David J. Search, and Clifford Allan Hobson "Phase-measuring methods for measurement of three-dimensional shapes in automated inspection of manufactured electronic assemblies", Proc. SPIE 2183, Machine Vision Applications in Industrial Inspection II, (11 March 1994); https://doi.org/10.1117/12.171213
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Cited by 9 scholarly publications.
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KEYWORDS
Fringe analysis

Inspection

Image processing

Fourier transforms

Image filtering

Manufacturing

Lead

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