Paper
30 September 1994 High-precision mechanical profilometer for grazing incidence optics
Joseph R. Cerino, Kristin L. Lewotsky, Robert Paul Bourgeois, Thomas E. Gordon
Author Affiliations +
Abstract
A high precision mechanical profilometer (MPROS) has been designed and utilized for metrology on the Advances X-Ray Astrophysics Facility (AXAF) optic program. The instrument serves both as a measure of axial figure during the grinding phase of mirror fabrication and as the AXAF program crosscheck for axial sag error. MPROS has demonstrated an accuracy of 0.25 micrometers P-P over nominally 1 meter of travel. The design is relatively simple, employing Hewlett Packard distance measuring interferometers, an air bearing slide, and coated Zerodur reference surface. This paper will present the AXAF axial metrology requirements, MPROS design, and reference surface calibration. System performance and results will be presented and discussed.
© (1994) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Joseph R. Cerino, Kristin L. Lewotsky, Robert Paul Bourgeois, and Thomas E. Gordon "High-precision mechanical profilometer for grazing incidence optics", Proc. SPIE 2263, Current Developments in Optical Design and Optical Engineering IV, (30 September 1994); https://doi.org/10.1117/12.188025
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CITATIONS
Cited by 2 scholarly publications.
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KEYWORDS
Calibration

Metrology

Mirrors

Optical testing

Polishing

Optical alignment

Profilometers

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