Paper
30 September 1994 Principal surface approach as means of precise RMS-roughness estimation in noncontact profilometry
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Abstract
A commonly used estimator for the microtopography of a surface is its RMS-roughness. Raw surface profile data may contain trending components. Therefore they should be subjected to a detrending procedure before estimating the RMS-value. This procedure is limited in most cases to the removal of piston, slope and curvature. Consequently, undesired artifacts may arise, which negatively influence the precision of RMS-roughness estimation. In scanning surface metrology, the principal surface computed by using eigenvalues and eigenvectors of the covariance matrix of the surface data under consideration can be used for a robust and precise multivariate estimation of RMS-roughness.
© (1994) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Hendrik Rothe, Angela Duparre, and Andre Kasper "Principal surface approach as means of precise RMS-roughness estimation in noncontact profilometry", Proc. SPIE 2263, Current Developments in Optical Design and Optical Engineering IV, (30 September 1994); https://doi.org/10.1117/12.188001
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Cited by 1 scholarly publication.
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KEYWORDS
Surface finishing

Atomic force microscopy

Mirrors

Polishing

Diamond

Silica

Photomicroscopy

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