Implementation of the "CLEAN" algorithm on microwave images for nondestructive testing

Solomon R. Ghorayeb; Mark T. Lusk

doi:10.1117/12.186706

14 September 1994 Implementation of the CLEAN algorithm on microwave images for nondestructive testing

Solomon R. Ghorayeb, Mark T. Lusk

Author Affiliations +

Proceedings Volume 2275, Advanced Microwave and Millimeter-Wave Detectors; (1994) https://doi.org/10.1117/12.186706
Event: SPIE's 1994 International Symposium on Optics, Imaging, and Instrumentation, 1994, San Diego, CA, United States

Abstract

An intuitive deconvolution algorithm known s CLEAN is considered as a means of improving images associated with microwave nondestructive evaluation (NDE). Flawed metallic surfaces are scanned using a continuous wave (cw), X-band synthetic aperture radar (SAR), and images are produced using a synthetic-aperture focusing algorithm. The results are compared with those obtained by further processing the data using the CLEAN algorithm. The utility of adopting such a scheme to improve flaw detection is discussed.

Citation Download Citation

Solomon R. Ghorayeb and Mark T. Lusk "Implementation of the CLEAN algorithm on microwave images for nondestructive testing", Proc. SPIE 2275, Advanced Microwave and Millimeter-Wave Detectors, (14 September 1994); https://doi.org/10.1117/12.186706

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