Importance of electron tracking in understanding the response of proportional counters

Jeffrey R. Youngen; Martin C. Weisskopf; Kurtis L. Dietz; Robert A. Austin; Stephen L. O'Dell; Brian D. Ramsey; Allyn F. Tennant

doi:10.1117/12.186808

16 September 1994 Importance of electron tracking in understanding the response of proportional counters

Jeffrey R. Youngen, Martin C. Weisskopf, Kurtis L. Dietz, Robert A. Austin, Stephen L. O'Dell, Brian D. Ramsey, Allyn F. Tennant

Author Affiliations +

Proceedings Volume 2280, EUV, X-Ray, and Gamma-Ray Instrumentation for Astronomy V; (1994) https://doi.org/10.1117/12.186808
Event: SPIE's 1994 International Symposium on Optics, Imaging, and Instrumentation, 1994, San Diego, CA, United States

Abstract

Design, construction, and sensitivity estimates for the performance of proportional counters customarily neglect the consequences of the finite path length of electrons resulting from the primary interaction between the incident x-ray and the proportional counter gas. In many situations this can lead to errors in response functions as a result of ignoring 'charge sharing' between adjacent proportional counter cells which are held in anti-coincidence, or charge lost by the electrons escaping the gas volume into the detector window or into inactive regions. We illustrate the importance of these effects with Monte-Carlo simulations.

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Jeffrey R. Youngen, Martin C. Weisskopf, Kurtis L. Dietz, Robert A. Austin, Stephen L. O'Dell, Brian D. Ramsey, and Allyn F. Tennant "Importance of electron tracking in understanding the response of proportional counters", Proc. SPIE 2280, EUV, X-Ray, and Gamma-Ray Instrumentation for Astronomy V, (16 September 1994); https://doi.org/10.1117/12.186808

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