X-ray characterization of an XMM mandrel at the European Synchrotron Radiation Facility

Philippe Gondoin; Andreas K. Freund; Samuel Gougeon; Daniel de Chambure; Kees van Katwijk; Danielle R. Labergerie; Ulrich Lienert; N. Schulz

doi:10.1117/12.212578

20 June 1995 X-ray characterization of an XMM mandrel at the European Synchrotron Radiation Facility

Philippe Gondoin, Andreas K. Freund, Samuel Gougeon, Daniel de Chambure, Kees van Katwijk, Danielle R. Labergerie, Ulrich Lienert, N. Schulz

Author Affiliations +

Proceedings Volume 2515, X-Ray and Extreme Ultraviolet Optics; (1995) https://doi.org/10.1117/12.212578
Event: SPIE's 1995 International Symposium on Optical Science, Engineering, and Instrumentation, 1995, San Diego, CA, United States

Abstract

The High Throughput X-Ray Spectroscopy Mission (XMM) is a `Cornerstone' project in the ESA long-term Programme for Space Science. The satellite observatory uses three grazing incidence telescopes coupled to reflection grating spectrometers and x-ray CCD cameras. Each XMM telescope consists of 58 Wolter I mirrors that are replicated from superpolished nickel coated mandrels. The mirror figure and finish specifications are tight and therefore it is essential to assess the surface quality of the mandrels. This is done in the workshop by a metrology system involving different profilometers. However, the performance of a mandrel can also be directly determined with x-ray tests that allow the user to verify the measurements of the workshop instruments. The ESRF synchrotron storage ring produces x-ray beams of very high quality and has a beamline dedicated to high resolution tests of x-ray optical components. One XMM mandrel was characterized on this beamline by a three axis x-ray scattering technique. Power spectral density functions and profile slopes were derived from the x-ray measurements and compared to those determined by the metrology instruments. The present paper describes the x-ray experiment and discusses its results in the context of the XMM mandrel manufacturing program.

Citation Download Citation

Philippe Gondoin, Andreas K. Freund, Samuel Gougeon, Daniel de Chambure, Kees van Katwijk, Danielle R. Labergerie, Ulrich Lienert, and N. Schulz "X-ray characterization of an XMM mandrel at the European Synchrotron Radiation Facility", Proc. SPIE 2515, X-Ray and Extreme Ultraviolet Optics, (20 June 1995); https://doi.org/10.1117/12.212578

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