Paper
25 September 1995 Direct observation of microscopic inhomogeneities in high-Tc superconductors using energy-dispersive diffraction of synchrotron-produced xrays
Earl F. Skelton, Syen B. Qadri, Michael S. Osofsky, A. R. Drews, P. R. Broussard, J. Z. Hu, L. W. Finger, Terrell A. Vanderah, D. Kaiser, J. L. Peng, Steven M. Anlage, Richard L. Greene, John Giapintzakis
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Abstract
Evidence of micron-sized structural inhomogeneities in several high transition temperature (Tc) superconductors is presented. By illuminating samples with high energy, highly collimated x rays produced on a synchrotron wiggler, small changes in the lattice were detected over a spatial scale as small as 10 micrometer. In the YBa2Cu3O7-(delta ) crystals, these changes are interpreted as evidence of variations in the oxygen content and in the Nd2-xCexCuO4-y crystal, as a variation in the cerium content. Each type of inhomogeneity can affect the superconducting properties.
© (1995) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Earl F. Skelton, Syen B. Qadri, Michael S. Osofsky, A. R. Drews, P. R. Broussard, J. Z. Hu, L. W. Finger, Terrell A. Vanderah, D. Kaiser, J. L. Peng, Steven M. Anlage, Richard L. Greene, and John Giapintzakis "Direct observation of microscopic inhomogeneities in high-Tc superconductors using energy-dispersive diffraction of synchrotron-produced xrays", Proc. SPIE 2516, X-Ray Microbeam Technology and Applications, (25 September 1995); https://doi.org/10.1117/12.221669
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Cited by 3 scholarly publications.
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KEYWORDS
Crystals

Superconductors

Diffraction

Oxygen

Cerium

X-rays

Thin films

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