Sensitivity to x-ray polarization of a microgap gas proportional counter

Paolo Soffitta; Enrico Costa; Ennio Morelli; Ronaldo Bellazzini; Alessandro Brez; R. Raffo

doi:10.1117/12.224922

16 October 1995 Sensitivity to x-ray polarization of a microgap gas proportional counter

Paolo Soffitta, Enrico Costa, Ennio Morelli, Ronaldo Bellazzini, Alessandro Brez, R. Raffo

Proceedings Volume 2517, X-Ray and EUV/FUV Spectroscopy and Polarimetry; (1995) https://doi.org/10.1117/12.224922
Event: SPIE's 1995 International Symposium on Optical Science, Engineering, and Instrumentation, 1995, San Diego, CA, United States

Abstract

We measured the average anisotropy of the primary charge cloud produced by photoelectron when an x-ray beam linearly polarized is absorbed on a Ne-DME gas mixture by using a micro-gap proportional counter. This average anisotropy is not present when an Fe55 unpolarized x-ray source is used. We discuss the results of our measurement in terms of performances of this detector as an x-ray polarimeter.

Citation Download Citation

Paolo Soffitta, Enrico Costa, Ennio Morelli, Ronaldo Bellazzini, Alessandro Brez, and R. Raffo "Sensitivity to x-ray polarization of a microgap gas proportional counter", Proc. SPIE 2517, X-Ray and EUV/FUV Spectroscopy and Polarimetry, (16 October 1995); https://doi.org/10.1117/12.224922

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