High-power uncooled silicon mirror transmitted beam diagnostics

David W. Callahan; Steven H. Bowersox; Paul H. Dickinson; Patrick J. Pomphrey Jr.

doi:10.1117/12.225280

23 October 1995 High-power uncooled silicon mirror transmitted beam diagnostics

David W. Callahan, Steven H. Bowersox, Paul H. Dickinson, Patrick J. Pomphrey Jr.

Proceedings Volume 2543, Silicon Carbide Materials for Optics and Precision Structures; (1995) https://doi.org/10.1117/12.225280
Event: SPIE's 1995 International Symposium on Optical Science, Engineering, and Instrumentation, 1995, San Diego, CA, United States

Abstract

Large aperture single crystal silicon turning flat mirrors provide a new method of high energy laser beam sampling for optical performance diagnostic measurements. This new sampling technique has been successfully implemented on the Alpha Laser Optimization program where transmitted beams through two, uncooled silicon mirrors have been used to measure total energy, instantaneous power, spectral content, and beam jitter. The accuracy of these measurements has been confirmed by independent measurements of these same parameters, and the results fall within expected error bars.

Citation Download Citation

David W. Callahan, Steven H. Bowersox, Paul H. Dickinson, and Patrick J. Pomphrey Jr. "High-power uncooled silicon mirror transmitted beam diagnostics", Proc. SPIE 2543, Silicon Carbide Materials for Optics and Precision Structures, (23 October 1995); https://doi.org/10.1117/12.225280

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