Paper
3 November 1995 Developing a new method of the optical diagnostics materials for opto-, micro-, and quantum electronics based on semiconductor superlattices
Olexander Yu. Semchuk, Leonid G. Grechko, Vitaly Pustovit
Author Affiliations +
Proceedings Volume 2648, International Conference on Optical Diagnostics of Materials and Devices for Opto-, Micro-, and Quantum Electronics; (1995) https://doi.org/10.1117/12.226209
Event: International Conference on Optical Diagnostics of Materials and Devices for Opto-, Micro-, and Quantum Electronics, 1995, Kiev, Ukraine
Abstract
In this paper the light reflection coefficient of the ferromagnetic semiconductor with superlattice is calculated. It is shown that the presence of superlattice will lead to the modulation of the light absorption coefficient of the ferromagnetic semiconductor. It is shown that on the basis of the ferromagnetic semiconductor with superlattice will be developing new methods of optical diagnostics materials for the opto- and quantum electronics.
© (1995) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Olexander Yu. Semchuk, Leonid G. Grechko, and Vitaly Pustovit "Developing a new method of the optical diagnostics materials for opto-, micro-, and quantum electronics based on semiconductor superlattices", Proc. SPIE 2648, International Conference on Optical Diagnostics of Materials and Devices for Opto-, Micro-, and Quantum Electronics, (3 November 1995); https://doi.org/10.1117/12.226209
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Cited by 1 scholarly publication.
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KEYWORDS
Superlattices

Semiconductors

Reflection

Electrons

Optical diagnostics

Ferromagnetics

Quantum electronics

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