Temperature dependence of the dielectric function of laser deposited YBCO thin films at 3392 nm

D. George Walmsley; T. Bade; Patrick G. McCafferty; Chris J. T. Rea; Paul Dawson; R. J. Wallace; Robert M. Bowman

doi:10.1117/12.241791

10 June 1996 Temperature dependence of the dielectric function of laser deposited YBCO thin films at 3392 nm

D. George Walmsley, T. Bade, Patrick G. McCafferty, Chris J. T. Rea, Paul Dawson, R. J. Wallace, Robert M. Bowman

Proceedings Volume 2696, Spectroscopic Studies of Superconductors; (1996) https://doi.org/10.1117/12.241791
Event: Photonics West '96, 1996, San Jose, CA, United States

Abstract

We have excited surface plasmons in a YBCO thin film at different temperatures using attenuated total reflection of light. The 300 nm thick c-axis film was fabricated using pulsed laser deposition onto an MgO (100) substrate with 248 nm KrF excimer radiation. Critical temperature of the film was 89.6 K and its roughness, as shown by atomic force microscopy, 20 nm rms, without droplets over areas of 10 micrometer by 10 micrometer. The sample was mounted in Otto geometry on a cooled stage which allowed the temperature to be varied between 300 K and 70 K. An infrared HeNe laser at 3392 nm was used to excite the surface plasmons. The dielectric function of the film was determined between room temperature and 80 K. The imaginary part of the dielectric function decreased substantially with reduction in temperature. Results obtained were: (epsilon) _r equals -24.1 plus 0.0013T and (epsilon) _i equals 7.7 plus 0.067T where T is the temperature in Kelvin. The ratio (epsilon) _i³⁰⁰/(epsilon) _i⁸⁰ at 2.13 is less than the resistance ratio R³⁰⁰/R⁸⁰ at 2.81. An explanation is offered in terms of two temperature independent mechanisms operative at optical frequencies: enhanced Rayleigh scattering of surface plasmons at grain boundaries and intraband/interband transitions. The real part of the dielectric function, (epsilon) _r, was found to be only slightly temperature dependent. It was, however, highly sample dependent when comparison was made with the results of other films, a feature attributed to surface and grain boundary contamination.

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D. George Walmsley, T. Bade, Patrick G. McCafferty, Chris J. T. Rea, Paul Dawson, R. J. Wallace, and Robert M. Bowman "Temperature dependence of the dielectric function of laser deposited YBCO thin films at 3392 nm", Proc. SPIE 2696, Spectroscopic Studies of Superconductors, (10 June 1996); https://doi.org/10.1117/12.241791

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KEYWORDS

Dielectrics

Scattering

Surface plasmons

Prisms

Temperature metrology

Reflectivity

Reflection

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