Absolute measurements of soft X-ray emission by laser plasma using thermoluminescent dosimeters and semiconductor detectors

M. Farnikova; Josef Krasa; Bozena Kralikova; Jiri Skala; Piotr Parys; Leszek Ryc; Jerzy Wolowski; Eugeniusz Woryna

doi:10.1117/12.232174

13 February 1996 Absolute measurements of soft X-ray emission by laser plasma using thermoluminescent dosimeters and semiconductor detectors

M. Farnikova, Josef Krasa, Bozena Kralikova, Jiri Skala, Piotr Parys, Leszek Ryc, Jerzy Wolowski, Eugeniusz Woryna

Author Affiliations +

Proceedings Volume 2767, Fourth International Workshop on Iodine Lasers and Applications; (1996) https://doi.org/10.1117/12.232174
Event: Fourth International Workshop on Iodine Lasers and Applications, 1995, Trest' Castle, Czech Republic

Abstract

Thermoluminescent dosimeters LiF:Mg,Ti (TLD100), LiF:Mg,Cu,P (GR200A) and CaF₂:Dy (TLD200) as well as Si commercial photodiodes, Polish production, BPYP44 type, were used for time-integrated absolute measurements of x-ray emission from laser-produced plasmas generated by a Nd:glass laser or an iodine photodissociation laser. All the detectors were calibrated by application of radioactive standard sources. Calibrated responses to x-ray radiation emitted from a laser-produced Al plasma are compared and a discrepancy in the results is discussed.

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M. Farnikova, Josef Krasa, Bozena Kralikova, Jiri Skala, Piotr Parys, Leszek Ryc, Jerzy Wolowski, and Eugeniusz Woryna "Absolute measurements of soft X-ray emission by laser plasma using thermoluminescent dosimeters and semiconductor detectors", Proc. SPIE 2767, Fourth International Workshop on Iodine Lasers and Applications, (13 February 1996); https://doi.org/10.1117/12.232174

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