Analysis of x-ray interferometers for phase distribution measurement

T. Nakano

doi:10.1117/12.2298890

1 September 1996 Analysis of x-ray interferometers for phase distribution measurement

T. Nakano

Proceedings Volume 2778, 17th Congress of the International Commission for Optics: Optics for Science and New Technology; 277808 (1996) https://doi.org/10.1117/12.2298890
Event: 17th Congress of the International Commission for Optics: Optics for Science and New Technology, 1996, Taejon, Korea, Republic of

Abstract

The X-ray interferometers are analyzed as a tool to measure a phase distribution of X-ray beams transmitted through phase objects. We calculate beam width using a dynamical diffraction theory of a spherical wave. The width defines the image resolution. From these results, it is found that the X ray quadruple-Lane-case (LLLL) interferometer has high image resolution compared with the X-ray triple-Lane-case (LLL) interferometer.

Citation Download Citation

T. Nakano "Analysis of x-ray interferometers for phase distribution measurement", Proc. SPIE 2778, 17th Congress of the International Commission for Optics: Optics for Science and New Technology, 277808 (1 September 1996); https://doi.org/10.1117/12.2298890

ACCESS THE FULL ARTICLE

INSTITUTIONAL
Select your institution to access the SPIE Digital Library.

SELECT YOUR INSTITUTION

PERSONAL
Sign in with your SPIE account to access your personal subscriptions or to use specific features such as save to my library, sign up for alerts, save searches, etc.

PERSONAL SIGN IN

No SPIE Account? Create one

PURCHASE THIS CONTENT

SUBSCRIBE TO DIGITAL LIBRARY

50 downloads per 1-year subscription

Members: $195

Non-members: $335 ADD TO CART

25 downloads per 1 - year subscription

Members: $145

Non-members: $250 ADD TO CART

PURCHASE SINGLE ARTICLE

Includes PDF, HTML & Video, when available