Elliptically polarizing undulator beamline 4.0.1 for magnetic spectroscopy at the Advanced Light Source

Vladimir V. Martynov; Anthony T. Young; Howard A. Padmore

doi:10.1117/12.259860

22 November 1996 Elliptically polarizing undulator beamline 4.0.1 for magnetic spectroscopy at the Advanced Light Source

Vladimir V. Martynov, Anthony T. Young, Howard A. Padmore

Author Affiliations +

Proceedings Volume 2856, Optics for High-Brightness Synchrotron Radiation Beamlines II; (1996) https://doi.org/10.1117/12.259860
Event: SPIE's 1996 International Symposium on Optical Science, Engineering, and Instrumentation, 1996, Denver, CO, United States

Abstract

A beamline for high resolution spectroscopy with elliptically polarized X-rays is described. The working energy range is large, from 20 eV to above 1800 eV. The resolving power is on the order of 10,000 at low energies (20 eV - 200 eV) and 6000 at high energies (200 eV - 1800 eV). This is achieved using a variable deviation angle plane grating monochromator. A single grating, with one line density and a varying groove depth, is used to cover the entire energy range. The beamline has been designed to operate with either one or two x-ray beams propagating simultaneously through the monochromator and to the experimental station. Switching between polarizations at rates of 0.1 Hz and slower is accomplished in the single beam mode by alternating the output of the elliptically polarized undulator source between left and right polarization. Fast polarization switching, at rates of 100 - 1000 Hz, is provided in the two beam mode by mechanical chopping between two photon beams, one of which is right circularly polarized, and the other left circularly polarized.

Citation Download Citation

Vladimir V. Martynov, Anthony T. Young, and Howard A. Padmore "Elliptically polarizing undulator beamline 4.0.1 for magnetic spectroscopy at the Advanced Light Source", Proc. SPIE 2856, Optics for High-Brightness Synchrotron Radiation Beamlines II, (22 November 1996); https://doi.org/10.1117/12.259860

ACCESS THE FULL ARTICLE

INSTITUTIONAL
Select your institution to access the SPIE Digital Library.

SELECT YOUR INSTITUTION

PERSONAL
Sign in with your SPIE account to access your personal subscriptions or to use specific features such as save to my library, sign up for alerts, save searches, etc.

PERSONAL SIGN IN

No SPIE Account? Create one

PURCHASE THIS CONTENT

SUBSCRIBE TO DIGITAL LIBRARY

50 downloads per 1-year subscription

Members: $195

Non-members: $335 ADD TO CART

25 downloads per 1 - year subscription

Members: $145

Non-members: $250 ADD TO CART

PURCHASE SINGLE ARTICLE

Includes PDF, HTML & Video, when available