Beam diagnostics challenges for future FELs

Alex H. Lumpkin

doi:10.1117/12.274369

15 May 1997 Beam diagnostics challenges for future FELs

Alex H. Lumpkin

Proceedings Volume 2988, Free-Electron Laser Challenges; (1997) https://doi.org/10.1117/12.274369
Event: Photonics West '97, 1997, San Jose, CA, United States

Abstract

Designs are being developed to produce diffraction-limited sources based on storage-ring free-electron lasers (FELs) for the VUV and soft x-ray regime and linac-driven FELs in the few angstrom regime. The requirements on the beam quality in transverse emittance (rms, normalized) of 1 - 2 pi mm mrad, bunch length (1 ps to 100 fs), and peak current (1 to 5 kA) result in new demands on the diagnostics. The diagnostics challenges include spatial resolution (1 - 10 micrometer), temporal resolution (less than 100 fs), and single-pulse position measurements (approximately 1 micrometer). Examples of recent submicropulse (slice) work are cited as well as concepts based on spontaneous emission radiation (SER). The nonintercepting aspects of some of these diagnostics should also be applicable to high-power FELs.

Citation Download Citation

Alex H. Lumpkin "Beam diagnostics challenges for future FELs", Proc. SPIE 2988, Free-Electron Laser Challenges, (15 May 1997); https://doi.org/10.1117/12.274369

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