Paper
15 July 1997 Practical accuracy factors in resistor-array infrared scene projector systems
Alan P. Pritchard, Mark A. Venables, Stephen Paul Lake, David W. Gough
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Abstract
This is the second in a series of papers describing an on- going investigation into the detailed performance of our resistor array infra-red scene projector devices and systems. The purpose is to extract understanding and information which will enable validation of simulations involving the systems, and design compromises to be resolved. Following last year's conclusions, the importance of Non Uniformity Correction is reinforced and the concept of Local Step Error and its importance is developed and investigated practically. A test methodology is developed, and the first steps in practical measurements are reported.
© (1997) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Alan P. Pritchard, Mark A. Venables, Stephen Paul Lake, and David W. Gough "Practical accuracy factors in resistor-array infrared scene projector systems", Proc. SPIE 3084, Technologies for Synthetic Environments: Hardware-in-the-Loop Testing II, (15 July 1997); https://doi.org/10.1117/12.280946
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Cited by 1 scholarly publication.
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KEYWORDS
Projection systems

Imaging systems

Resistors

Collimators

Contrast transfer function

Nonuniformity corrections

Image registration

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