Paper
1 April 1997 Analysis of polarized light in multilayers
Jaromir Pistora, Roman Kantor, Nicolas Negre, Kamil Postava, Romana Anyzova, Jaromir Seidl
Author Affiliations +
Proceedings Volume 3094, Polarimetry and Ellipsometry; (1997) https://doi.org/10.1117/12.271820
Event: Polarimetry and Ellipsometry, 1996, Kazimierz Dolny, Poland
Abstract
Through the extension of the matrix formalism the dispersion properties of multilayered waveguides for TE and TM modes are expressed in simple formulas. The considerations of waveguiding are investigated in isotropic absorbing and nonabsorbing film systems. The influence of position, thickness and absorption of the central thin film on the propagation of the light in five layered planar waveguides are analyzed in detail. When the central metallic absorbing film is located in the middle of the structure the expressive suppressing of guided modes of the even orders in perceptible. The results show that the guided mode tuning effect can be realized with nonabsorbing structure. The important dependence of effective refraction indices of the guided modes on the central film thickness has been observed.
© (1997) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Jaromir Pistora, Roman Kantor, Nicolas Negre, Kamil Postava, Romana Anyzova, and Jaromir Seidl "Analysis of polarized light in multilayers", Proc. SPIE 3094, Polarimetry and Ellipsometry, (1 April 1997); https://doi.org/10.1117/12.271820
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