Electro-optic spatial light modulator characterization using Mueller matrix imaging

Elizabeth A. Sornsin; Russell A. Chipman

doi:10.1117/12.278966

3 October 1997 Electro-optic spatial light modulator characterization using Mueller matrix imaging

Elizabeth A. Sornsin, Russell A. Chipman

Proceedings Volume 3121, Polarization: Measurement, Analysis, and Remote Sensing; (1997) https://doi.org/10.1117/12.278966
Event: Optical Science, Engineering and Instrumentation '97, 1997, San Diego, CA, United States

Abstract

A series of electro-optic spatial light modulators have been measured with the Mueller matrix imaging polarimeter (MMIP). The MMIP is a dual rotating-retarder polarimeter which illuminates a sample with calibrated polarized states and analytes the existing polarized state over a spatially resolved image of the sample. Images of the retardance magnitude and retardance fast axis orientation reveal the relative electric field strengths in a device with lead- lanthanum-zirconate-titanate modulating material. By measuring Mueller matrix images of the device at several different applied voltages, a quadratic electro-optic coefficient of 2 X 10^-16 (m/V)² was determined in the modulator active regions.

Citation Download Citation

Elizabeth A. Sornsin and Russell A. Chipman "Electro-optic spatial light modulator characterization using Mueller matrix imaging", Proc. SPIE 3121, Polarization: Measurement, Analysis, and Remote Sensing, (3 October 1997); https://doi.org/10.1117/12.278966

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