Toward a model accounting for the impact of surface treatment on the performances of scintillation counters

Christian Moisan; Anthony Levin; H. Laman

doi:10.1117/12.279244

26 September 1997 Toward a model accounting for the impact of surface treatment on the performances of scintillation counters

Christian Moisan, Anthony Levin, H. Laman

Author Affiliations +

Proceedings Volume 3141, Scattering and Surface Roughness; (1997) https://doi.org/10.1117/12.279244
Event: Optical Science, Engineering and Instrumentation '97, 1997, San Diego, CA, United States

Abstract

A new model to treat the interactions of scintillation photons with dielectric surfaces is being implemented in DETECT, a public domain optical photon transport simulator for the design of scintillation counters. Inspired from the initial work of Nayar et al., the new UNIFIED model has the particular advantage of merging, into a single parameterization, models that usually apply over a very limited range of surface roughness values. Its flexibility is ensured by using the standard deviation of the surface slope as an input parameter that can be extracted from simple surface profile data. Here, we start by presenting the implementation of the UNIFIED model into DETECT. A prescription to constrain its free parameters with a simple set of characterization data is also discussed. The model is then tested for its capacity to predict the photoelectron yields measured for BGO crystals with different surface finish and reflective coats. Current results indicate that the transport of scintillation photons internally trapped within the volume of a highly polished crystal is well accounted for. However, significant discrepancies are noted between predictions and measurements when considering a corrugated finish or when the surface is coated by a diffuse reflector. Possible explanations are discussed and subject to further investigations.

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Christian Moisan, Anthony Levin, and H. Laman "Toward a model accounting for the impact of surface treatment on the performances of scintillation counters", Proc. SPIE 3141, Scattering and Surface Roughness, (26 September 1997); https://doi.org/10.1117/12.279244

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