XUV laser grid image refractometry applied in laser hole boring experiments

Kenjiro Takahashi; Ryosuke Kodama; Kazuo A. Tanaka; Hiroyuki Hashimoto; Yoshiaki Kato; Kunioki Mima; Kensuki Murai; Franz A. Weber; Troy W. Barbee Jr.; Peter M. Celliers; Luiz Barroca Da Silva

doi:10.1117/12.279407

1 November 1997 XUV laser grid image refractometry applied in laser hole boring experiments

Kenjiro Takahashi, Ryosuke Kodama, Kazuo A. Tanaka, Hiroyuki Hashimoto, Yoshiaki Kato, Kunioki Mima, Kensuki Murai, Franz A. Weber, Troy W. Barbee Jr., Peter M. Celliers, Luiz Barroca Da Silva

Author Affiliations +

Proceedings Volume 3156, Soft X-Ray Lasers and Applications II; (1997) https://doi.org/10.1117/12.279407
Event: Optical Science, Engineering and Instrumentation '97, 1997, San Diego, CA, United States

Abstract

We measured laser channeling into an overdense plasma by using a 19.6 nm Ne-like Ge XUV laser. One micrometer/100 ps laser light at 10¹⁷ W/cm² interacted with a long scale length plasma preformed on a CH slab target. Grid image refractometry (GIR) with the x-ray laser was applied to obtain the deflection information in the plasma, which provided two dimensional density profiles (2-D) of the overdense plasmas.

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Kenjiro Takahashi, Ryosuke Kodama, Kazuo A. Tanaka, Hiroyuki Hashimoto, Yoshiaki Kato, Kunioki Mima, Kensuki Murai, Franz A. Weber, Troy W. Barbee Jr., Peter M. Celliers, and Luiz Barroca Da Silva "XUV laser grid image refractometry applied in laser hole boring experiments", Proc. SPIE 3156, Soft X-Ray Lasers and Applications II, (1 November 1997); https://doi.org/10.1117/12.279407

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