Roughness-induced absorption, scattering ellipsometry, and multidielectric resonances for laser damage investigation

Claude Amra; Sophie Maure; Carole Deumie; Hugues Giovannini; Jean-Yves Natoli

doi:10.1117/12.306971

20 April 1998 Roughness-induced absorption, scattering ellipsometry, and multidielectric resonances for laser damage investigation

Claude Amra, Sophie Maure, Carole Deumie, Hugues Giovannini, Jean-Yves Natoli

Author Affiliations +

Proceedings Volume 3244, Laser-Induced Damage in Optical Materials: 1997; (1998) https://doi.org/10.1117/12.306971
Event: Laser-Induced Damage in Optical Materials: 1997, 1997, Boulder, CO, United States

Abstract

We present new improvements that were achieved at LOSCM Marseilles for a better characterization of optical thin films. Roughness-induced absorption, angular ellipsometry of light scattering and multidielectric resonances are discussed in multilayers. Theoretical and experimental results are given and new applications are emphasized.

Citation Download Citation

Claude Amra, Sophie Maure, Carole Deumie, Hugues Giovannini, and Jean-Yves Natoli "Roughness-induced absorption, scattering ellipsometry, and multidielectric resonances for laser damage investigation", Proc. SPIE 3244, Laser-Induced Damage in Optical Materials: 1997, (20 April 1998); https://doi.org/10.1117/12.306971

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