Image formation properties of As40S20Se40 thin layers

Alexander V. Stronski; Miroslav Vlcek; A. Sklenar; Peter E. Shepeljavi; Pavel F. Oleksenko; Tomas Wagner

doi:10.1117/12.304529

26 March 1998 Image formation properties of As₄₀S₂₀Se₄₀ thin layers

Alexander V. Stronski, Miroslav Vlcek, A. Sklenar, Peter E. Shepeljavi, Pavel F. Oleksenko, Tomas Wagner

Proceedings Volume 3294, Holographic Materials IV; (1998) https://doi.org/10.1117/12.304529
Event: Photonics West '98 Electronic Imaging, 1998, San Jose, CA, United States

Abstract

The present paper is concerned with investigations of image formation properties of As₄₀S₂₀Se₄₀ thin layers. Spectral dependence of the refraction index n of variously treated samples was estimated from optical transmission in the spectral region 400-2500 nm. The n energy dependence of variously treated samples was fitted by the Wemple- DiDomenico dispersion relationship and used to estimate the single-oscillator model parameters. It was found, that exposure, as well as annealing leads to the increase in n values over the all investigated spectral region. Changes of the parameters of the single-oscillator model induced by treatment are discussed on the base of photo- and thermally- induced structural changes, which were directly confirmed by Raman scattering measurements. Such photoinduced structural changes provide good etching selectivity of As₄₀S₂₀Se₄₀ layers in nonaqueous amine based solvents. The best obtained sensitivity values consisted of approximately 40 cm²/J. Surface relief patterns that were fabricated have good surface quality.Diffraction efficiency values of holographic diffraction gratings obtained on the base of As₄₀S₂₀Se₄₀ layers consisted of 60-70 percent.

Citation Download Citation

Alexander V. Stronski, Miroslav Vlcek, A. Sklenar, Peter E. Shepeljavi, Pavel F. Oleksenko, and Tomas Wagner "Image formation properties of As₄₀S₂₀Se₄₀ thin layers", Proc. SPIE 3294, Holographic Materials IV, (26 March 1998); https://doi.org/10.1117/12.304529

ACCESS THE FULL ARTICLE

INSTITUTIONAL
Select your institution to access the SPIE Digital Library.

SELECT YOUR INSTITUTION

PERSONAL
Sign in with your SPIE account to access your personal subscriptions or to use specific features such as save to my library, sign up for alerts, save searches, etc.

PERSONAL SIGN IN

No SPIE Account? Create one

PURCHASE THIS CONTENT

SUBSCRIBE TO DIGITAL LIBRARY

50 downloads per 1-year subscription

Members: $195

Non-members: $335 ADD TO CART

25 downloads per 1 - year subscription

Members: $145

Non-members: $250 ADD TO CART

PURCHASE SINGLE ARTICLE

Includes PDF, HTML & Video, when available