Paper
23 March 1998 Optical metrology for industrialization of optical information processing
David P. Casasent, Charles L. Wilson
Author Affiliations +
Abstract
One of the major barriers to commercial application of optical technology to information processing is the high cost of system development and manufacture. This problem has been solved in other industries through the use of computer aided design (CAD) and integration of system design with manufacturing. The development of better system level metrology is needed to allow more computer-based methods to be used in this process. As a test case, we are designing an optical pattern recognition system to be performed on an input image (at video rates) versus a large reference set, for example 1000 faces, with images of 640 by 480 pixels or larger. We have constructed both an optical pattern recognition system and a holographic memory system which we have instrumented and used to address the metrological needs of these applications. This has allowed us to evaluate the level of system and component level metrology needed for real-time video processing. This report addressed the metrological issues encountered in building and testing these systems.
© (1998) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
David P. Casasent and Charles L. Wilson "Optical metrology for industrialization of optical information processing", Proc. SPIE 3386, Optical Pattern Recognition IX, (23 March 1998); https://doi.org/10.1117/12.304750
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Cited by 4 scholarly publications.
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KEYWORDS
Spatial light modulators

Optical correlators

Optical storage

Computer aided design

Fourier transforms

Modulation

Image processing

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