Computation of the intensity distribution for a film on a GRIN substrate

Mario Marcelo Lehman; Mario Garavaglia

doi:10.1117/12.328471

30 October 1998 Computation of the intensity distribution for a film on a GRIN substrate

Mario Marcelo Lehman, Mario Garavaglia

Proceedings Volume 3426, Scattering and Surface Roughness II; (1998) https://doi.org/10.1117/12.328471
Event: SPIE's International Symposium on Optical Science, Engineering, and Instrumentation, 1998, San Diego, CA, United States

Abstract

A theoretical formalism to study the scattering by reflection from a vitreous film on a planar medium with graded refraction index is developed. It is employed the impedance function, which characterizes the interface between two media and the diffuse diffraction pattern is obtained The medium is characterized using the function sech(x) in the refraction index and then, general and particular conclusions can be obtained starting from the surface impedance function.

Citation Download Citation

Mario Marcelo Lehman and Mario Garavaglia "Computation of the intensity distribution for a film on a GRIN substrate", Proc. SPIE 3426, Scattering and Surface Roughness II, (30 October 1998); https://doi.org/10.1117/12.328471

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