Progress in replication of substrates for multilayer coatings

Suzanne E. Romaine; John E. Everett; Ricardo J. Bruni; Adrian Ivan; Paul Gorenstein; Mauro Ghigo; Francesco Mazzoleni; Oberto Citterio; Joseph Pedulla

doi:10.1117/12.331277

19 November 1998 Progress in replication of substrates for multilayer coatings

Suzanne E. Romaine, John E. Everett, Ricardo J. Bruni, Adrian Ivan, Paul Gorenstein, Mauro Ghigo, Francesco Mazzoleni, Oberto Citterio, Joseph Pedulla

Author Affiliations +

Proceedings Volume 3444, X-Ray Optics, Instruments, and Missions; (1998) https://doi.org/10.1117/12.331277
Event: SPIE's International Symposium on Optical Science, Engineering, and Instrumentation, 1998, San Diego, CA, United States

Abstract

Studies are being carried out to compare the performance of several different separation materials used in the replication process. This report presents the results obtained during the second year of a program which consists of replicating smooth, thin substrates, depositing multilayer coatings upon them, and evaluating their performance. Replication smooth, thin substrates, depositing multilayer coatings upon them, and evaluating their performance. Replication and multilayer coatings are both critically important to the development of focussing hard x- ray telescopes that function up to 100 keV. The activities of the current year include extending the comparison between sputtered amorphous carbon and evaporated gold to include sputtered as well as evaporated gold. The figure of merit being the smoothness of the replica which has a direct effect on the specular reflectivity. These results were obtained with epoxy replication, but they should be applicable to electroformed nickel, the process we expect to use for the ultimate replicated optics.

Citation Download Citation

Suzanne E. Romaine, John E. Everett, Ricardo J. Bruni, Adrian Ivan, Paul Gorenstein, Mauro Ghigo, Francesco Mazzoleni, Oberto Citterio, and Joseph Pedulla "Progress in replication of substrates for multilayer coatings", Proc. SPIE 3444, X-Ray Optics, Instruments, and Missions, (19 November 1998); https://doi.org/10.1117/12.331277

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