Paper
13 October 1998 Raman spectroscopy: probing the border between near-field and far-field spectroscopy
Hans D. Hallen, Michael A. Paesler, Catherine L. Jahncke
Author Affiliations +
Abstract
We have performed Raman spectroscopy using a near-field scanning optical microscope. The small sample volume coupled with the light-starved nature of the Raman effect makes nano-Raman studies difficult. We present results showing near-field effects in an investigation of Rb-doped KTP. These effects include a change in selection rules due to the presence of a z-polarization component in the near-field, a surface-enhancement effect in near-field Raman data, a reduced Rayleigh tail, and simultaneous topography with the near-field probe. An image taken within a Raman feature demonstrates that nano-Raman imaging is indeed possible if the near-field instrument has considerable long-term stability.
© (1998) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Hans D. Hallen, Michael A. Paesler, and Catherine L. Jahncke "Raman spectroscopy: probing the border between near-field and far-field spectroscopy", Proc. SPIE 3467, Far- and Near-Field Optics: Physics and Information Processing, (13 October 1998); https://doi.org/10.1117/12.326819
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KEYWORDS
Near field

Raman spectroscopy

Near field scanning optical microscopy

Raman scattering

Ferroelectric materials

Micro raman spectroscopy

Rayleigh scattering

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