Paper
5 August 1998 Optical and structural characteristics of InGaAs/GaAs strained-layer superlattice
Mei Li, Xueqian Li, Xiaowei Song, Zhongjiu Ge, Xingde Zhang
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Abstract
In the present work, the structure characteristics on InGaAs-GaAs/GaAs strained-layer superlattice (SLS) samples have been studied by measuring x-ray double crystal rocking curve in the non-paralle (+.-) setting and photoluminescence (PL), respectively. Using x-ray kinematical theory, we have calculated structure parameters of SLS and discussed the influence of different substrates. Computer simulation of experimental curve have been performed with kinematical diffraction theory. The experimental and simulated curves are basically identical. Reliability of calculated results using x-ray double rocking curve is further confined by PL.
© (1998) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Mei Li, Xueqian Li, Xiaowei Song, Zhongjiu Ge, and Xingde Zhang "Optical and structural characteristics of InGaAs/GaAs strained-layer superlattice", Proc. SPIE 3557, Current Developments in Optical Elements and Manufacturing, (5 August 1998); https://doi.org/10.1117/12.318274
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KEYWORDS
Laser sintering

X-rays

Superlattices

Crystals

X-ray diffraction

Diffraction

Satellites

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