Measurement technology of ultrafast optoelectronics

Jilong Wang; Yuncai Wang; Shijie Chen

doi:10.1117/12.318371

10 August 1998 Measurement technology of ultrafast optoelectronics

Jilong Wang, Yuncai Wang, Shijie Chen

Proceedings Volume 3558, Automated Optical Inspection for Industry: Theory, Technology, and Applications II; (1998) https://doi.org/10.1117/12.318371
Event: Photonics China '98, 1998, Beijing, China

Abstract

This paper reviews recent progress in ultrafast optoelectronic measurement techniques utilizing ultrafast optical pulses, with particular emphasis on the wide range of novel applications of ultrafast optoelectronics for generation and measurement of ultrafast electrical signal. Such specific high-speed optoelectronic measurement techniques as photoconductive sampling, electro-optic sampling, picosecond photoemissive sampling etc. are described.

Citation Download Citation

Jilong Wang, Yuncai Wang, and Shijie Chen "Measurement technology of ultrafast optoelectronics", Proc. SPIE 3558, Automated Optical Inspection for Industry: Theory, Technology, and Applications II, (10 August 1998); https://doi.org/10.1117/12.318371

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