Enhanced x-ray images using amorphous silicon arrays

William F. Hartman; Eric S. Boltz

doi:10.1117/12.339872

8 February 1999 Enhanced x-ray images using amorphous silicon arrays

William F. Hartman, Eric S. Boltz

Proceedings Volume 3585, Nondestructive Evaluation of Aging Materials and Composites III; (1999) https://doi.org/10.1117/12.339872
Event: Nondestructive Evaluation Techniques for Aging Infrastructures and Manufacturing, 1999, Newport Beach, CA, United States

Abstract

TPL, in collaboration with Xerox Palo Alto Research Center and Thermotrex, is developing advanced amorphous silicon sensor arrays for primary application to nondestructive evaluation. Amorphous silicon flat panel technology provides unique capabilities which are directly applicable to a number of NDE and process verification applications. Like other digital radiography technologies, amorphous silicon arrays (ASAs) greatly reduce inspection time, materials use and waste products associated with conventional radiographic inspection. Unlike techniques based on charge coupled devices, ASAs also provide a format that is analogous to the use of film; that is direct exposure and large area imaging. This unique combination of traits from both film-like systems and camera-like systems makes ASAs ideal for a wide range of applications. With careful considerations of the advantages and limitations of ASA technology, implementation of high performance, cost-effective inspection systems based on this enabling technology can be achieved. This paper discusses the current state of ASA technology, as well as the potential for ASA technology advances, and presents results pertinent to NDE applications.

Citation Download Citation

William F. Hartman and Eric S. Boltz "Enhanced x-ray images using amorphous silicon arrays", Proc. SPIE 3585, Nondestructive Evaluation of Aging Materials and Composites III, (8 February 1999); https://doi.org/10.1117/12.339872

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