Paper
12 July 1999 Magnetic shape memory (MSM) effect in textured polycrystalline Ni2MnGa
Yossef Ezer, Alexei Sozinov, Giora Kimmel, V. Etaleaniemi, N. I. Glavatskaya, A. D'Anci, V. Podgursky, Veikko K. Lindroos, Kari Ullakko
Author Affiliations +
Abstract
Materials that develop large shape changes in the magnetic field at a short response time provide a new method of producing motion and force in electromechanical devices. The strains are based on the magnetic-field-induced reorientation of the twin variants of the material. This effect is called magnetic shape memory (MSM) effect, because the shape of the material can be controlled by the magnetic field. MSM effect can operate in the martensite phase, and it does not require temperature changes to occur unlike regular shape memory effect (SME). Ni-Mn-Ga alloys and several iron-based alloys are currently being developed by many research groups. In this report, magnetic-field-induced strain of two polycrystalline non-stoichiometric Ni2MnGa alloys with oriented crystal structure were studied during cooling through the martensitic transformation temperature (Ms) and at a constant temperature below Ms. X-ray diffraction measurements confirmed that the origin of the induced strains was the change of the proportions of different twin orientations. Frequency response of the MSM strains in the alloy was shown to be over 5 kHz. One of the present alloys was deposited by laser ablation on a silicon substrate. The thin film exhibits tetragonal lattice structure.
© (1999) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Yossef Ezer, Alexei Sozinov, Giora Kimmel, V. Etaleaniemi, N. I. Glavatskaya, A. D'Anci, V. Podgursky, Veikko K. Lindroos, and Kari Ullakko "Magnetic shape memory (MSM) effect in textured polycrystalline Ni2MnGa", Proc. SPIE 3675, Smart Structures and Materials 1999: Smart Materials Technologies, (12 July 1999); https://doi.org/10.1117/12.352795
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Cited by 12 scholarly publications.
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KEYWORDS
Magnetism

X-ray diffraction

Crystals

Temperature metrology

Laser ablation

Silicon

Semiconductor lasers

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