Test and performance of the engineering model of PICsIT: the high-energy detector plane on board the INTEGRAL satellite

Claudio Labanti; Elio Rossi; Fulvio Gianotti; Filomena Schiavone; Alessandro Traci; Alessandro Mauri; P. Bastia; E. Cavazzuti

doi:10.1117/12.366534

22 October 1999 Test and performance of the engineering model of PICsIT: the high-energy detector plane on board the INTEGRAL satellite

Claudio Labanti, Elio Rossi, Fulvio Gianotti, Filomena Schiavone, Alessandro Traci, Alessandro Mauri, P. Bastia, E. Cavazzuti

Author Affiliations +

Proceedings Volume 3765, EUV, X-Ray, and Gamma-Ray Instrumentation for Astronomy X; (1999) https://doi.org/10.1117/12.366534
Event: SPIE's International Symposium on Optical Science, Engineering, and Instrumentation, 1999, Denver, CO, United States

Abstract

IBIS is a space-telescope designed to produce sky images in the 15 keV to 10 MeV energy range with an angular resolution of several arcminutes over a wide field of view. This is obtained by deconvolving the shadow gram projected by a coded mask onto two pixelated detector layers sensitive to the incident radiation interaction position. The upper layer, ISGRI, consists of 16384 CdTe elements operating in the low energy range, while the underlying layer, PICsIT, is made up of 8 identical modules housing altogether 4096 CsI(TI) scintillating crystals coupled to PIN photodiodes operating in the 0.15 to 10 MeV energy range. The expected performances of IBIS were described in a dedicated session of the SPIE Symposium in August 1996, while performances of the PICsIT single detection units have been presented at SPIE in July 1998.

Citation Download Citation

Claudio Labanti, Elio Rossi, Fulvio Gianotti, Filomena Schiavone, Alessandro Traci, Alessandro Mauri, P. Bastia, and E. Cavazzuti "Test and performance of the engineering model of PICsIT: the high-energy detector plane on board the INTEGRAL satellite", Proc. SPIE 3765, EUV, X-Ray, and Gamma-Ray Instrumentation for Astronomy X, (22 October 1999); https://doi.org/10.1117/12.366534

ACCESS THE FULL ARTICLE

INSTITUTIONAL
Select your institution to access the SPIE Digital Library.

SELECT YOUR INSTITUTION

PERSONAL
Sign in with your SPIE account to access your personal subscriptions or to use specific features such as save to my library, sign up for alerts, save searches, etc.

PERSONAL SIGN IN

No SPIE Account? Create one

PURCHASE THIS CONTENT

SUBSCRIBE TO DIGITAL LIBRARY

50 downloads per 1-year subscription

Members: $195

Non-members: $335 ADD TO CART

25 downloads per 1 - year subscription

Members: $145

Non-members: $250 ADD TO CART

PURCHASE SINGLE ARTICLE

Includes PDF, HTML & Video, when available