Paper
25 April 2000 Solid state VRX CT detector
Frank A. DiBianca, Roman Melnyk, Aniket Sambari, Lawrence M. Jordan, Joseph S. Laughter, Ping Zou
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Abstract
A technique called Variable-Resolution X-ray (VRX) detection that greatly increases the spatial resolution in computed tomography (CT) and digital radiography (DR) is presented. The technique is based on a principle called 'projective compression' that allows the resolution element of a CT detector to scale with the subject or field size. For very large (40 - 50 cm) field sizes, resolution exceeding 2 cy/mm is possible and for very small fields, microscopy is attainable with resolution exceeding 100 cy/mm. Preliminary results from a 576-channel solid-state detector are presented. The detector has a dual-arm geometry and is comprised of CdWO4 scintillator crystals arranged in 24 modules of 24 channels/module. The scintillators are 0.85 mm wide and placed on 1 mm centers. Measurements of signal level, MTF and SNR, all versus detector angle, are presented.
© (2000) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Frank A. DiBianca, Roman Melnyk, Aniket Sambari, Lawrence M. Jordan, Joseph S. Laughter, and Ping Zou "Solid state VRX CT detector", Proc. SPIE 3977, Medical Imaging 2000: Physics of Medical Imaging, (25 April 2000); https://doi.org/10.1117/12.384494
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CITATIONS
Cited by 4 scholarly publications.
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KEYWORDS
Sensors

Modulation transfer functions

Solid state electronics

Signal to noise ratio

X-ray detectors

Data acquisition

Scintillators

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