Paper
29 November 2000 Comparison of surface morphologies of HgCdTe films grown by MBE and LPE
Jianrong Yang, Shanli Wang, Xinqiang Chen, Weizheng Fang, Meifang Yu, Gensheng Huang, He Li
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Proceedings Volume 4086, Fourth International Conference on Thin Film Physics and Applications; (2000) https://doi.org/10.1117/12.408387
Event: 4th International Conference on Thin Film Physics and Applications, 2000, Shanghai, China
Abstract
The surface morphologies of both MBE and LPE HgCdTe films were observed by optical microscope and atom force microscope. Both HgCdTe films were grown on CdZnTe substrates. It was found that the surface morphology of LPE film is very sensitive to the orientation of CdZnTe substrate, while MBE film surface morphology is mainly dependent on the surface morphology of the substrate. The characteristic of the surface morphologies and the non- flatness of HgCdTe LPE and MBE films in different scales are studied.
© (2000) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Jianrong Yang, Shanli Wang, Xinqiang Chen, Weizheng Fang, Meifang Yu, Gensheng Huang, and He Li "Comparison of surface morphologies of HgCdTe films grown by MBE and LPE", Proc. SPIE 4086, Fourth International Conference on Thin Film Physics and Applications, (29 November 2000); https://doi.org/10.1117/12.408387
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KEYWORDS
Mercury cadmium telluride

Liquid phase epitaxy

Surface finishing

Atomic force microscopy

Optical microscopes

Epitaxy

Chemical species

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