Refractive index modifications and thermal properties of optical thin films with the prism coupler

Francois Flory; Pascal Huguet-Chantome; Ludovic Escoubas; Serge Monneret

doi:10.1117/12.408381

29 November 2000 Refractive index modifications and thermal properties of optical thin films with the prism coupler

Francois Flory, Pascal Huguet-Chantome, Ludovic Escoubas, Serge Monneret

Proceedings Volume 4086, Fourth International Conference on Thin Film Physics and Applications; (2000) https://doi.org/10.1117/12.408381
Event: 4th International Conference on Thin Film Physics and Applications, 2000, Shanghai, China

Abstract

The prism coupler can be used with a single beam to measure the refractive indices of isotropic or anisotropic single layers and of layers in multilayer stacks with an accuracy of 1. X 10^-3. The refractive index modification with temperature can also be measured easily. The refractive index of a thin film can also change under illumination. A two-beam set-up has been developed to achieve a very high sensitivity of 1. X 10^-6 on the refractive index changes. The nonlinear response of the layer's materials is mainly due to thermal effects. As well the diffusion length of the effect as the frequency response are measured even for low absorbing thin films. Examples of measurements are given. The heat equations permit to calculate the temperature distribution in the whole system so that both theoretical and experimental means can now be used to determine thermal properties of materials in thin film form.

Citation Download Citation

Francois Flory, Pascal Huguet-Chantome, Ludovic Escoubas, and Serge Monneret "Refractive index modifications and thermal properties of optical thin films with the prism coupler", Proc. SPIE 4086, Fourth International Conference on Thin Film Physics and Applications, (29 November 2000); https://doi.org/10.1117/12.408381

ACCESS THE FULL ARTICLE

INSTITUTIONAL
Select your institution to access the SPIE Digital Library.

SELECT YOUR INSTITUTION

PERSONAL
Sign in with your SPIE account to access your personal subscriptions or to use specific features such as save to my library, sign up for alerts, save searches, etc.

PERSONAL SIGN IN

No SPIE Account? Create one

PURCHASE THIS CONTENT

SUBSCRIBE TO DIGITAL LIBRARY

50 downloads per 1-year subscription

Members: $195

Non-members: $335 ADD TO CART

25 downloads per 1 - year subscription

Members: $145

Non-members: $250 ADD TO CART

PURCHASE SINGLE ARTICLE

Includes PDF, HTML & Video, when available

Members: $17.00

Non-members: $21.00 ADD TO CART

PROCEEDINGS
5 PAGES

DOWNLOAD PAPER SAVE TO MY LIBRARY

GET CITATION

RIGHTS & PERMISSIONS

Get copyright permission Get copyright permission on Copyright Marketplace

KEYWORDS

Refractive index

Thin films

Prisms

Temperature metrology

Ions

Plating

Thermography

Show All Keywords

Keywords/Phrases

Search In:

Publication Years