Fitting method for analyzing polarized x-rays on CCD camera

Masahiro Tsujimoto; Hiroshi Murakami; Kenji Hamaguchi; Takeshi G. Tsuru; Hisamitsu Awaki; Katsuji Koyama

doi:10.1117/12.409119

13 December 2000 Fitting method for analyzing polarized x-rays on CCD camera

Masahiro Tsujimoto, Hiroshi Murakami, Kenji Hamaguchi, Takeshi G. Tsuru, Hisamitsu Awaki, Katsuji Koyama

Proceedings Volume 4140, X-Ray and Gamma-Ray Instrumentation for Astronomy XI; (2000) https://doi.org/10.1117/12.409119
Event: International Symposium on Optical Science and Technology, 2000, San Diego, CA, United States

Abstract

CCDs can function as the X-ray spectrometer by counting the number of electrons created by the ionization of semiconductor atoms following the photoelectric absorption of an X-ray photon. In order to measure the incident X-ray energy correctly, we have to sum up all the electrons split over several pixels, thus the grade method is conventionally used. We will discuss the possible alternative to this method -- the fitting method --, which has several advantages over the grade method. By applying this method to the data taken with our CCD chip, we will show that the fitting method can improve the quantum efficiency, is applicable to the analysis of polarized X-ray events, and gives us insights on the structure of CCDs.

Citation Download Citation

Masahiro Tsujimoto, Hiroshi Murakami, Kenji Hamaguchi, Takeshi G. Tsuru, Hisamitsu Awaki, and Katsuji Koyama "Fitting method for analyzing polarized x-rays on CCD camera", Proc. SPIE 4140, X-Ray and Gamma-Ray Instrumentation for Astronomy XI, (13 December 2000); https://doi.org/10.1117/12.409119

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