Paper
13 December 2000 In-flight calibration of the XMM-Newton reflection grating spectrometers
Christian Erd, M. Audard, Antonius J. F. den Boggende, Graziella Branduardi-Raymont, A. C. Brinkman, Jean Cottam, Luc Dubbeldam, Manuel Guedel, Jan-Willem den Herder, Jelle S. Kaastra, Steven M. Kahn, Rolf Mewe, Frits B. S. Paerels, John Russell Peterson, Andrew P. Rasmussen, Irini Sakelliou, Joshua Spodek, Knud Thomsen, Cor P. de Vries, Alex Zehnder
Author Affiliations +
Abstract
The activities during the instrument calibrations are summarized and first data are presented. The main instrument features, the line-spread function and the effective area, are discussed and the status of the in-flight calibrations is summarized.
© (2000) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Christian Erd, M. Audard, Antonius J. F. den Boggende, Graziella Branduardi-Raymont, A. C. Brinkman, Jean Cottam, Luc Dubbeldam, Manuel Guedel, Jan-Willem den Herder, Jelle S. Kaastra, Steven M. Kahn, Rolf Mewe, Frits B. S. Paerels, John Russell Peterson, Andrew P. Rasmussen, Irini Sakelliou, Joshua Spodek, Knud Thomsen, Cor P. de Vries, and Alex Zehnder "In-flight calibration of the XMM-Newton reflection grating spectrometers", Proc. SPIE 4140, X-Ray and Gamma-Ray Instrumentation for Astronomy XI, (13 December 2000); https://doi.org/10.1117/12.409112
Advertisement
Advertisement
RIGHTS & PERMISSIONS
Get copyright permission  Get copyright permission on Copyright Marketplace
KEYWORDS
Calibration

Charge-coupled devices

Roentgenium

Dispersion

Cameras

Diffraction gratings

Spectrometers

RELATED CONTENT

Limits of spectral resolution in optical measurements
Proceedings of SPIE (August 22 2014)
HETG high-order diffraction efficiency
Proceedings of SPIE (November 19 1998)
Raytracing with MARX x ray observatory design, calibration,...
Proceedings of SPIE (September 25 2012)
Optical design for the 5 to 28 um NGST MIRI...
Proceedings of SPIE (March 05 2003)
Grating arrays for high-throughput soft x-ray spectrometers
Proceedings of SPIE (January 29 2004)

Back to Top