Paper
9 October 2000 Image-based recognition of the chip shape
Xianli Liu, Guoliang Zhao, Lin Lin, An Meng
Author Affiliations +
Proceedings Volume 4221, Optical Measurement and Nondestructive Testing: Techniques and Applications; (2000) https://doi.org/10.1117/12.402626
Event: Optics and Optoelectronic Inspection and Control: Techniques, Applications, and Instruments, 2000, Beijing, China
Abstract
According to the profile characteristics of the extracted chip form and the number of nodes between profile and * line which have the same gravity, chip species are discerned. The chip types near the critical joint are judged exactly through the standard tolerance of all direction nodes. It was tested to have a high accordant rate.
© (2000) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Xianli Liu, Guoliang Zhao, Lin Lin, and An Meng "Image-based recognition of the chip shape", Proc. SPIE 4221, Optical Measurement and Nondestructive Testing: Techniques and Applications, (9 October 2000); https://doi.org/10.1117/12.402626
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Cited by 1 scholarly publication.
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KEYWORDS
Image processing

Tolerancing

Shape analysis

Sensors

CCD cameras

Control systems

Failure analysis

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