High-sensitivity high-dynamic digital CMOS imager

Martin Waeny; Steve Tanner; Stefan C. Lauxtermann; Nicolas Blanc; M. Willemin; Martin Rechsteiner; Elko Doering; Joachim Grupp; Peter Seitz; Fausto Pellandini; Michael Ansorge

doi:10.1117/12.426992

15 May 2001 High-sensitivity high-dynamic digital CMOS imager

Martin Waeny, Steve Tanner, Stefan C. Lauxtermann, Nicolas Blanc, M. Willemin, Martin Rechsteiner, Elko Doering, Joachim Grupp, Peter Seitz, Fausto Pellandini, Michael Ansorge

Author Affiliations +

Proceedings Volume 4306, Sensors and Camera Systems for Scientific, Industrial, and Digital Photography Applications II; (2001) https://doi.org/10.1117/12.426992
Event: Photonics West 2001 - Electronic Imaging, 2001, San Jose, CA, United States

Abstract

CMOS image sensors offer over the standard and ubiquitous charge-coupled devices several advantages, in terms of power consumption, miniaturization, on-chip integration of analog- to-digital converters and signal processing for dedicated functionality. Due to the typically higher readout noise of CMOS cameras compared to CCD cameras applications demanding ultimate sensitivity were so far not accessible to CMOS cameras. This paper present an analysis of major noise sources, concepts to reduce them, and results obtained ona single chip digital camera with a QCIF resolution of 144 by 176 pixels and a dynamic range in excess of 120 dB.

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Martin Waeny, Steve Tanner, Stefan C. Lauxtermann, Nicolas Blanc, M. Willemin, Martin Rechsteiner, Elko Doering, Joachim Grupp, Peter Seitz, Fausto Pellandini, and Michael Ansorge "High-sensitivity high-dynamic digital CMOS imager", Proc. SPIE 4306, Sensors and Camera Systems for Scientific, Industrial, and Digital Photography Applications II, (15 May 2001); https://doi.org/10.1117/12.426992

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