Paper
14 August 2001 Specification and identification of woven patterns based on Fourier techniques
Author Affiliations +
Proceedings Volume 4419, 4th Iberoamerican Meeting on Optics and 7th Latin American Meeting on Optics, Lasers, and Their Applications; (2001) https://doi.org/10.1117/12.437187
Event: IV Iberoamerican Meeting of Optics and the VII Latin American Meeting of Optics, Lasers and Their Applications, 2001, Tandil, Argentina
Abstract
A new method to identify the weave repeat and the repetition pattern from the power spectrum of a woven fabric is presented. The results obtained from the analysis of some real samples are presented and discussed.
© (2001) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Jaume Escofet, Maria Sagrario Millan Garcia-Verela, and Manuel Rallo "Specification and identification of woven patterns based on Fourier techniques", Proc. SPIE 4419, 4th Iberoamerican Meeting on Optics and 7th Latin American Meeting on Optics, Lasers, and Their Applications, (14 August 2001); https://doi.org/10.1117/12.437187
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Cited by 3 scholarly publications.
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KEYWORDS
Fourier transforms

Picosecond phenomena

Convolution

Laser optics

Statistical analysis

Defect detection

Digital image processing

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