Paper
21 December 2001 Comparison between diffraction intensity for different planar geometries
Mario Marcelo Lehman, Carlos I. Aguirre-Velez
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Abstract
We study the properties of the self-similarity function for the intensity distribution of field when different types of gratings, fractal, periodic and aleatory, are used. For this we introduce some definitions considering different points of view that allows us the construction of the diffraction gratings with each geometry. Such structures are applied for the calculation of the electromagnetic field propagation in the Fresnel and Fraunhofer regions.
© (2001) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Mario Marcelo Lehman and Carlos I. Aguirre-Velez "Comparison between diffraction intensity for different planar geometries", Proc. SPIE 4436, Wave-Optical Systems Engineering, (21 December 2001); https://doi.org/10.1117/12.451296
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KEYWORDS
Fractal analysis

Diffraction gratings

Diffraction

Electromagnetism

Superposition

Far-field diffraction

Inverse optics

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