Paper
2 October 2001 Reliability of micro-electro-mechanical systems (MEMS)
Srinivas Tadigadapa, Nader Najafi
Author Affiliations +
Proceedings Volume 4558, Reliability, Testing, and Characterization of MEMS/MOEMS; (2001) https://doi.org/10.1117/12.443002
Event: Micromachining and Microfabrication, 2001, San Francisco, CA, United States
Abstract
Reliability is a key parameter for the eventual prevalence of microelectromechanical systems (MEMS) as either sub-components or as standalone products. Traditionally, micromachined components have been made by separating the micromachined chip design and fabrication processes from the packaging and reliability issues.
© (2001) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Srinivas Tadigadapa and Nader Najafi "Reliability of micro-electro-mechanical systems (MEMS)", Proc. SPIE 4558, Reliability, Testing, and Characterization of MEMS/MOEMS, (2 October 2001); https://doi.org/10.1117/12.443002
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Cited by 24 scholarly publications.
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KEYWORDS
Reliability

Sensors

Microelectromechanical systems

Packaging

Silicon

Biomedical optics

Interfaces

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