Paper
19 April 2002 Standardizable method for testing foil-substrate adherence
Karel J. Schell, Han Klinker, Rudolf L. van Renesse
Author Affiliations +
Proceedings Volume 4677, Optical Security and Counterfeit Deterrence Techniques IV; (2002) https://doi.org/10.1117/12.462727
Event: Electronic Imaging, 2002, San Jose, California, United States
Abstract
An increasing number of currencies is provided with an Optically Variable Device (OVD) as a counterfeit deterrent. The device is adhered to the substrate by a hot melt adhesive. Adherence is generally tested with an adhesive tape, a practical test that sufficed up to now. Nevertheless, the question may be raised if a method can be developed with a better discriminating power as well as a larger potential for standardization. A feasibility test with the IGT printability tester, using a high viscosity pick up oil, shows promising results. This paper presents the testing method, shows a few preliminary results and discusses these results with respect to the foil application method.
© (2002) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Karel J. Schell, Han Klinker, and Rudolf L. van Renesse "Standardizable method for testing foil-substrate adherence", Proc. SPIE 4677, Optical Security and Counterfeit Deterrence Techniques IV, (19 April 2002); https://doi.org/10.1117/12.462727
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KEYWORDS
Adhesives

Diffusion

Lead

Holography

Photography

Security printing

Surface roughness

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